Abstract
X-ray diffraction analysis is a convenient and important route to investigate crystalline materials. With mesoporous materials, Al-SBA-15 as target, the effects of scatter slit, soller slit and receiving slit of Bruker D8 ADVANCE diffractometer on the small-angle diffraction pattern based on information, such as the background intensity, peak height, intensity and full width at half maximum, which provide the evidence for slits selection.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
