Abstract

Aim Of Study: To evaluate the microleakge of self – etch adhesive system at the coronal (enamel) and apical (dentin) margins of class V resin composite restoration. Methods: Forty eight Class V cavities are prepared [3.0mm X 3.0mm X 1.5 mm (depth)] on the facial or lingual surface of the non carious tooth with coronal margins in enamel and apical margins in cementum / dentin at the cemento- enamel junction. The preparation will be restored using self – etch adhesive systems (Xeno V, G- Bond, & clearfil S 3 Bond) and a control (no adhesive), followed by insertion of Filtek TM P60 resin composite. The teeth were subjected to thermocycled and immersed in 1% aqueous solution of methylene blue dye for 24 hours. Later sectioned for assessment of microleakage under microscope. Results: The restored teeth with Xeno V exhibited significantly less leakage than the other adhesive groups in coronal margin, and other group’s shows intermediate leakage. The restored teeth treated with clearfil S 3 exhibited significantly less leakage than other groups in apical margin, and other group’s shows intermediate leakage. The control group shows more leakage in both the coronal and apical margins. Interpretation & Conclusion: Under the conditions of this in vitro study: 1) At the coronal margin, the preparations treated with Xeno V showed significantly less leakage than the other groups. 2) At the apical margin, the preparations treated with Clearfil S 3 Bond revealed significantly less leakage

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