Abstract
The high thermal conductivity of Aluminum nitride, coupled with its high electrical resistivity and nontoxic nature, makes it a very promising material for electronic substrate. In this study, microstructural characterization on the thermal conductivity of AlN ceramics was investigated. An AlN ceramic was prepared with a dopant Y2O3 under a reducing nitrogen atmosphere with carbon. In order to obtain high thermal conductivity, cooling rate control and after-heat treatment was carried out. Morphology of the second phase was characterized using scanning electron microscopy (SEM). SEM studies showed that the microstructural change caused by after-heat treatment have a major influence on the thermal conductivity.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
