Abstract
The Total reflection X-ray Fluorescence technique is increasingly popular for its simplicity and rapid elemental screening. This study evaluates the various analytical parameters including spectroscopic resolution, absolute sensitivity, relative element sensitivity, lowest limits of detection, accuracy and precision of the Total reflection X-ray Fluorescence spectrometer. This evaluation is conducted using quartz and acrylic sample carriers with mono and multi-element standards. Notably, the quartz sample carrier demonstrated excellent values of spectroscopic resolution, absolute sensitivity, the lowest limits of detection, a recovery rate of 90–110% and a coefficient of variation of 3–6% for the quantified elements from mono and multi-element standards. These findings underscore the robust analytical capability of the Total reflection X-ray Fluorescence technique for multi-trace elemental analysis. This research article not only provides practical and straightforward guidelines for handling Total reflection X-ray Fluorescence spectrometer but also confirms the practicality and effectiveness of the sample carriers for rapid and reliable elemental screening applications.
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