Abstract

Titanium dioxide (TiO2) thin films were doped with samarium ion at different concentration ratios (y = ([Sm3+]/[Ti4+]) in the range of 0–1 at. % by a step of 0.25 at. %) and deposited on glass substrates, using a spray pyrolysis technique. Samples were characterized using X-ray diffraction (XRD), Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM), and photoluminescence spectroscopy, with a special emphasis on the evolution of their physic-chemical properties as a function of their Sm doping ratio. Typically, a decrease in the crystalline quality of the anatase phase is observed when the nominal Sm content increases from 0.25 to 1 at. %. A change of photoluminescence behavior of the titania films is also evidenced when the Sm content increases. Wemple-Di Domenico single oscillator model was applied in order to study the dispersion parameters as a function of Sm doping ratio.

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