Abstract
All naturally occurring crack-like defects in solid structures are rough to some degree, which can affect defect inspection and characterization. Based on the simulated array data for various rough cracks and the total focusing method imaging algorithm, the effect of roughness on defect imaging and characterization was discussed. The array data was simulated by using the forward model combining with scattering matrices for various rough cracks. The scattering matrix describes the scattering field of a scatterer from all possible incident and scattering directions. It is shown that roughness can be either beneficial or detrimental to the detectability of a crack-like defect, depending on the defect characteristics such as length, roughness, correlation length, orientation angle, and array inspection configuration. It is also shown that roughness can cause the underestimation of length of rough crack-like defects by using the image-based approach.
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