Abstract
A numerical analysis of the influence of pump reflections on the carrier generation rate and the uniformity of carrier population in the quantum wells (QWs) of vertical-cavity surface-emitting lasers is presented. We have applied an approach allowing us to study the carrier distribution over the absorbing layers and the QW layers of the structure which is quite general and for an arbitrary function of the local carrier generation rate. When analysing the dual-wavelength VECSEL (Leinonen T et al 2007 Opt. Express 15 13451–6), we have found that application of carrier transport blocking layers can result in a highly uniform QW carrier population. The pump reflections are shown to have a great impact on the carrier distribution in the device under study.
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