Abstract
In this work, CuO films were deposited for various pH values (pH = 9, pH = 9.5, pH = 10) by Successive Ionic Layer Adsorption and Reaction (SILAR) method. The effects of pH on structural (X-ray diffraction (XRD)), morphological (field emission–scanning electron microscopy (FESEM)), and optical (ultraviolet/visible (UV/vis.) properties of the films were investigated. XRD experiments evidence that the crystallization of the films increased with decreasing the pH value. The texture coefficient, the dislocations, the strain and the grain size values were derived from X-ray diffraction experiments. FESEM images reveal that the grain size of the films increased with decreasing the pH value of the solution. By UV/vis. analysis, it is found that increasing pH value has a decreasing effect on band gap energy. The other optical constants including the refractive index (n), and extinction coefficient (k) are investigated using absorbance spectra. A significant reduction in refractive index values was observed with a decrease of pH values of the solution. Raman spectrum results sustain the single phase formation of films. The investigations showed that the low pH value has a significant effect on the physical properties of SILAR produced CuO films.
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