Abstract
We study the impact of non-square potential well structure on the electron mobility μ of double quantum well (DQW) based field effect transistors carved out of the AlxGa1-xAs alloy. The barriers lying towards the substrate and surface sides of the DQW are delta doped with Si. We consider DQWs having V-shaped (VDQW), parabolic (PDQW), cubic (CDQW) and square (SDQW) potential wells to obtain the low temperature double subband electron mobility μ. We consider ionized impurity (Imp-) and alloy disorder (Al-) scatterings to calculate μ as a function of well width w and surface electron density NS. We show that the changes in the structure potentials influence the interplay of intersubband effects on the scattering mechanisms differently causing μ(VDQW) < μ(PDQW) ≅ μ(CDQW) as a function of w whereas μ(VDQW) < μ(PDQW) < μ(CDQW) as a function of Ns. We show that μ increases not only with increase in the width of the central barrier b but also decrease with the height of the non-square potentials. Our results can be utilized to analyze the effect of non-square quantum well potentials on the channel conductivity of the quantum well modulation doped field effect transistors.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.