Abstract
To date, there are relatively few studies on polymer applications in space, especially those related to the evaluation of the dielectric breakdown resistance in the space environment. Polyimide (Kapton?) is extensively used in space in the thermal control of satellites but as a soft material subject to the aggressive space environment, it experiences degradation of properties during its lifetime. One property commonly affected in space is the surface electrical breakdown strength. The accumulation of charges on the surface of the Kapton occurs due to the formation of low-density hot plasma around the surface and due to the bombardment by highly energetic charged particles from space. The accumulation of charges can lead to deleterious electrical discharge on the surface of the material. In this study, aluminized Kapton, in the form of a film, has been treated by nitrogen plasma immersion ion implantation (PIII) inside a metallic tube. Mesh assisted and non-mesh assisted PIII have been tested. The influence of the ion implantation on the surface electrical breakdown strength of the treated samples has been determined using Weibull probability distribution function. The morphology of treated samples has been characterized by Atomic Force Microscopy. Results of the PIII treatment on morphology and surface electrical breakdown strength of Kapton are presented and discussed in this paper.
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