Abstract
Ti2AlN ceramic have been prepared by self-propagating high-temperature synthesis method using Ti, Al and TiAl mixture as raw materials under different N2 pressures. X-ray diffraction (XRD) and scanning electron microscope (SEM) have been used to determine the phase composition and micro morphology of the products. XRD analysis indicates that the main phase of the products is layered ternary compound Ti2AlN, but there are TiN and AlTi3 impurities in the products. With increasing N2 pressure, the relative content of TiN increases, whereas the relative content of AlTi3 decreases. SEM imagines exhibits that layered grains of the products become larger and tighter with increasing N2 pressures.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.