Effect of mutagen-ethyl methane sulphonate on yield increasing parameters of French bean (Phaseolus vulgarisl.)

Abstract

The present investigation was undertaken at the Vegetable Research Farm, Department of Vegetable Science, Punjab Agricultural University, Ludhiana, INDIA during spring season of 2015 and 2016 with objective to induce genetic variability for yield and quality traits in cultivars ?Contender? and ?Arka Komal? through chemical mutagen- ethyl methane sulphonate (EMS) at 0.15, 0.25 and 0.35%. Seed treatment with all the EMS concentration drastically reduced its germination but the germination per cent decreased with increase in concentration of EMS. The per cent seed germination was maximum (90%) in control ?Contender? whereas it was 74%, 49% and 42% in EMS at 0.15%, 0.25% and 0.35%, respectively. Similar trend of results for germination percentage were obtained in cultivar ?Arka Komal? after treatment with different concentrations of EMS, however germination percentage of ?Arka Komal? was lower than of ?Contender?. The germination percentage trends of EMS treated French bean cultivars were comparable under field and laboratory conditions but somewhat less under field due to less favourable conditions. All the plants harvested in M1 generation in both cultivars were sown in plant to progeny fashion along with parents. Several desirable plants were selected in M2 generation for early flowering, number of pods per plant, pod length and bean common mosaic virus (BCMV) resistance in both the cultivars at different concentrations of EMS. Selection was also performed for straight pods in case of genotype 'Contender'. The maximum frequency of desirable mutants was observed in lower EMS concentration (0.15%). The 0.15% EMS increased number of pods per plant which may be directly related to yield per plant and it will ultimately increase the total yield. Therefore, EMS concentration at 0.15% can be effectively used for inducing maximum variability in French bean. The mutant population developed in M2 generation can be further used to check its performance in next generations.