Abstract
We theoretically analyze the influence of the micromagnetic probe used in ferromagnetic resonance force microscopy (FMRFM) on the ferromagnetic resonance (FMR) modes in a thin ferromagnetic film. Our analysis of the FMRFM force response reveals three regimes defined by the extent to which the probe perturbs the uniform FMR mode. With closer approach, the FMRFM force grows more slowly because the strengthening probe field suppresses the FMR response. Our analysis agrees well with experimental data and provides theoretical foundations for FMRFM imaging.
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