Effect of Leaf Rust on Grain Yield and Yield Traits of Durum Wheats with Race-Specific and Slow-Rusting Resistance to Leaf Rust.

Abstract

Leaf rust, caused by Puccinia triticina, is an important disease of durum wheat (Triticum turgidum) in many countries. We compared the effectiveness of different types of resistance in International Maize and Wheat Improvement Center-derived durum wheat germ plasm for protecting grain yield and yield traits. In all, 10 durum wheat lines with race-specific resistance, 18 with slow-rusting resistance, and 2 susceptible were included in two yield loss trials sown on different planting dates in Mexico with and without fungicide protection under high disease pressure. Eight genotypes with race-specific resistance were immune to leaf rust. Durum wheat lines with slow-rusting resistance displayed a range of severity responses indicating phenotypic diversity. Mean yield losses for susceptible, race-specific, and slow-rusting genotypes were 51, 5, and 26%, respectively, in the normal sowing date trial and 71, 11, and 44% when sown late. Yield losses were associated mainly with a reduction in biomass, harvest index, and kernels per square meter. Slow-rusting durum wheat lines with low disease levels and low yield losses, as well as genotypes with low yield losses despite moderate disease levels, were identified. Such genotypes can be used for breeding durum wheat genotypes with higher levels of resistance and negligible yield losses by using strategies that previously have been shown to be successful in bread wheat.