Abstract
A REMMA 102 scanning electron microscope equipped with semiconductor and wave spectrometers is applied to measure the copper and zinc concentrations in the surface layers of an M161 brass sample and the same sample subjected to a focused laser radiation. The results are compared with the results obtained with an MS3101 laser mass spectrometer having a laser-plasma ion source. The laser-assisted erosion of the surface layer in the brass is shown to significantly change the copper and zinc concentrations. It is found that, when the craters produced by laser pulses on the initial surface do not overlap, the copper and zinc contents in the laser-induced plasma correspond to their contents in the sample.
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