Abstract
Epitaxial YBa 2Cu 3O y (YBCO) thin films have been fabricated by chemical solution deposition (CSD) on La 2Zr 2O 7-buffered YSZ single crystal substrate, where the buffer layer has three kinds of morphology – flat surface, rough surface and pore surface. The effect of LZO buffer layer’s roughness on the YBCO films was evaluated by X-ray diffraction, scanning electron microscopy and temperature-dependent resistivity measurements. The flat surface of LZO layer is beneficial to highly epitaxial YBCO films and high critical current density.
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