Abstract
The objective of this study is to determine and examine the effect of variations in the ionizing and displacive radiation environments on the microstructure of oxide ceramic insulators. Cross section transmission electron microscopy has been used to investigate the microstructure of MgAl{sub 2}O{sub 4} (spinel) and Al{sub 2}O{sub 3} (alumina) following irradiation with ions of varying mass and energy at room temperature and 650{degree}C. These results clearly indicate that light ion and electron irradiations produce microstructures which are not representative of the microstructure that would form in these ceramics during fission or fusion neutron irradiation.
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