Abstract
The effect of ion implantation and ion beam mixing, and their combined effect on the surface properties of iron is investigated. A comparison of the electrochemical behaviour of samples treated in these three approaches demonstrates that I c (the critical current density) and I m (the minimum anodic passivating current density) observed in samples treated under the combined action of ion implantation and ion beam mixing can be lowered mixing. Transmission electron microscopy (TEM) studies of the sample surfaces confirm the presence of a layer of amorphous alloy in all the sample surfaces under study.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
