Abstract
We studied time-resolved carrier recombination in InAs/GaAs quantum dot (QD) solar cells. The electric field in a p-i-n diode structure spatially separates photoexcited carriers in QDs, strongly affecting the conversion efficiency of intermediate-band solar cells. The radiative decay lifetime is dramatically reduced in a strong electric field (193 kV/cm) by efficient recombination due to strong carrier localization in each QD and significant tunneling-assisted electron escape. Conversely, an electric field of the order of 10 kV/cm maintains electronic coupling in the stacked QDs and diminishes tunneling-assisted electron escape.
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