Effect of interface states on the performance of GaAs p+-i far-infrared detectors

Abstract

Interface states have been shown to have an appreciable effect on the performance of p-GaAs multilayer (p+-i-p+-i-…) homojunction interfacial work function internal photoemission (HIWIP) far-infrared detectors. In this article, a comparison of detector performance was made of p-GaAs HIWIP detectors with different interface state densities, with the emphasis on the detector’s dark current, noise, and capacitance characteristics.