Abstract
胶质红外量子点优异的光学性能使其荧光特性具有广泛的应用前景，在实际应用中通常需要封装成薄膜形态以保持稳定的荧光特性。然而，分散形式的改变可能会导致量子点荧光效率降低以及荧光角度特性变化。因此，建立了红外量子点荧光强度探测系统，对胶质红外量子点薄膜在不同角度激发光入射时产生的荧光分布情况进行研究。实验及分析结果表明，激发光与样品表面夹角大小在10°～170°之间的较大范围内入射时，在反射及透射荧光区域均可探测到荧光峰值强度70%～80%以上的荧光出射，在这一范围内的反射荧光与透射荧光强度差异和荧光强度随激发光入射角度的变化规律分别与样品中量子点的浓度以及分布形态有关。同时，随着入射激光能量的增强，样品出射荧光强度对于入射角度变化的“平坦”范围进一步扩大。
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