Abstract

Raman spectroscopy was applied to different-impurities-doped 6H-SiC crystals. It had been found that the first-order Raman spectra of N-, Al- and B-doped 6H-SiC were shifted to higher frequency when comparing with undoped samples. However, the first-order Raman spectra of V-doped sample was shifted to lower frequency, revealing that there existed low free carrier concentration, which might be induced by the deep energy level effect of V impurity. Meanwhile, the second-order Raman spectra are independent of polytype and impurity type.

Highlights

  • Silicon carbide (SiC), one of the oldest known semiconductor materials, has received special attention in recent years because of its suitability for electronic and optoelectronic devices operating under high temperature, high power, high frequency, and/or strong radiation conditions[1,2,3,4,5]

  • We investigate the effect of these impurities on Raman scattering at room temperature

  • There are a large number of SiC polytypes for which the stacking sequences of double atomic planes of Si-C along the c-direction are different

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Summary

Introduction

Silicon carbide (SiC), one of the oldest known semiconductor materials, has received special attention in recent years because of its suitability for electronic and optoelectronic devices operating under high temperature, high power, high frequency, and/or strong radiation conditions[1,2,3,4,5]. Nitrogen (N) or phosphorus (P) for n-type, aluminum (Al) or boron (B) for p-type and vanadium (V) for semi-insulating type, are often chosen for SiC doping These impurities-doped SiC crystals are widely applicable. In addition to other techniques, including atomic force microscopy (AFM) and scanning electron microscopy (SEM), Raman spectroscopy is becoming an increasingly common analysis method It offers fast and contact-free measurements with easy sample preparation. The Raman scattering on N-doped SiC has been reported in many papers[7,14,15,16,17] In this case, the significant changes could be observed in the shape and position of the A longitudinal optical (LO) phonon as a function of doping concentration.

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