Abstract

Hydrogenated amorphous silicon thin films doped with chalcogens (Se or S) were prepared by the decomposition of silane (SiH 4 ) and H 2 Se/H 2 S gas mixtures in an RF plasma glow discharge on 7059 corning glass at a substrate temperature 230 °C. The illumination measurements were performed on these samples as a function of doping concentration, temperature and optical density. The activation energy varied with doping concentration and is higher in Se-doped than S-doped a-Si:H thin films due to a low defect density. From intensity versus photoconductivity data, it is observed that the addition of Se and S changes the recombination mechanism from monomolecular at low doping concentration films to bimolecular at higher doping levels. The photosensitivity ( σ ph / σ d ) of a-Si, Se:H thin films decreases as the gas ratio H 2 Se/SiH 4 increased from 10 −4 to 10 −1 , while the photosensitivity of a-Si, S:H thin films increases as the gas ratio H 2 S/SiH 4 increased from 6.8 × 10 −7 to 1.0×10 −4 .

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