Abstract
The reformation and characterisation of the passive film formed on ultra-thin 316 L after hydrogen charging is investigated by combining EBSD, TMDS, XRD, Synchrotron-based XPS, and electrochemical experiments. The results show that ultra-thin foil reforms a passive film after 12 h of hydrogen release in NaCl solution. The reformed passive film is half the thickness of the as-received passive film and is dominated by Cr oxides/hydroxides. The lattice extension caused by residual hydrogen accelerates Cr migration to form Cr2O3; while the diffusible hydrogen occupies the cation vacancies and results in high defect density for the reformed passive film within 12 h.
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