Abstract

We investigated the effect of H2 dilution on the stability of hydrogenated amorphous silicon oxide (a-Si1-xOx:H) films and solar cells. a-Si1-xOx:H films were prepared by very high frequency plasma-enhanced chemical vapor deposition (VHF-PECVD) using a gas mixture of silane (SiH4), hydrogen (H2), and carbon dioxide (CO2). The degradation results after light soaking for 310 h under AM1.5, 125 mW/cm2 at 48 °C clearly showed that the film and device stabilities were improved substantially with increasing H2 dilution. Our best stable result with a high open-circuit voltage (Voc) of 1.03 V for a-Si1-xOx:H single-junction solar cells showed a degradation of 16.6%. This result indicates that the stability against the light soaking of the a-Si1-xOx:H material is not inferior to that of a conventional hydrogenated amorphous silicon (a-Si:H) material. The temperature dependences of current–voltage (I–V) characteristics observed before and after light soaking showed that a-Si1-xOx:H solar cells had a similar temperature dependence to conventional a-Si:H solar cells.

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