Abstract
Time dependent photoluminescence and radioluminescence for sodium (Na) and thallium (Tl) activated cesium iodide (CsI) single crystals exposed to 50% and 75% relative humidity (RH) has been investigated. These results indicate that Tl activated crystals are more robust than the Na activated crystals against humidity induced scintillation degradation. The development of “etching pits” and “inactive” domains are the characteristics of deteriorated Na activated CsI crystals. These “inactive” domains, bearing a resemblance to a polycrystalline appearance beneath the crystal surface, can be readily detected by a 250 nm light emitting diode. These features are commonly observed at the corners and deep scratched areas where moisture condensation is more likely to occur. Mechanisms contributing to the scintillation degradation in Na activated CsI crystals were investigated by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). ToF-SIMS depth profiles indicate that Na has been preferentially diffused out of CsI crystal, leaving the Na concentration in these “inactive” domains below its scintillation threshold.
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