Abstract
In this work, the effect of annealing on the ZnO/Cu/ZnO films prepared by an RF/DC magnetron sputtering system was studied. Structural, optical, and thermal properties of both the as-prepared samples and their annealing data were systematically investigated. Our evaluation shows that these layers can be used as suitable coatings in energy storage applications. The ZnO/Cu/ZnO sample after annealing at 400 °C has the lowest resistivity (14.04Ω/sq), highest FOM (6.37 × 10−4 Ω−1), and lowest emissivity (0.16). It can also be chosen as the best coating on building windows to save energy because of its high transmittance at 550 nm (68%) and low U-value (1.63 W/Cm2.K).
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