Effect of guide field on three-dimensional electron shear flow instabilities in electron current sheets

Abstract

We examine, in the limit of electron plasma ${\it\beta}_{e}\ll 1$, the effect of an external guide field and current sheet thickness on the growth rates and nature of three-dimensional (3-D) unstable modes of an electron current sheet driven by electron shear flow. The growth rate of the fastest growing mode drops rapidly with current sheet thickness but increases slowly with the strength of the guide field. The fastest growing mode is tearing type only for thin current sheets (half-thickness ${\approx}d_{e}$, where $d_{e}=c/{\it\omega}_{pe}$ is the electron inertial length) and zero guide field. For finite guide field or thicker current sheets, the fastest growing mode is a non-tearing type. However, growth rates of the fastest 2-D tearing and 3-D non-tearing modes are comparable for thin current sheets ($d_{e}<\text{half thickness}<2\,d_{e}$) and small guide field (of the order of the asymptotic value of the component of magnetic field supporting the electron current sheet). It is shown that the general mode resonance conditions for tearing modes depend on the effective dissipation mechanism. The usual tearing mode resonance condition ($\boldsymbol{k}\boldsymbol{\cdot }\boldsymbol{B}_{0}=0$, $\boldsymbol{k}$ is the wavevector and $\boldsymbol{B}_{0}$ is the equilibrium magnetic field) can be recovered from the general resonance conditions in the limit of weak dissipation. The conditions (relating current sheet thickness, strength of the guide field and wavenumbers) for the non-existence of tearing mode are obtained from the general mode resonance conditions. We discuss the role of electron shear flow instabilities in magnetic reconnection.