Abstract

AbstractPoly(vinylidene fluoride)‐Graphene Oxide composite films were prepared by solution casting followed by hot press technique with variation of Graphene Oxide content up to 1.6 vol%. High Resolution Scanning Electron Microscope and Raman spectroscopy were used to investigate the morphology and the dispersion of GO. X‐ray diffraction (XRD) and Fourier transform infrared spectra were analyzed to identify and estimate the fraction of β phase. All the composite film samples are found to have fraction of β phase >80%. Dielectric constant of the composite films increases with increase in Graphene Oxide content up to 0.15 vol% and with further increment; it causes decrease in dielectric constant. Both dielectric loss tangent and ac conductivity show increasing trend with increment of Graphene Oxide content. Both remnant polarization and energy density are affected by Graphene Oxide loading. Remnant polarization increases with Graphene Oxide content whereas energy density follows the same variation trend that of dielectric constant.

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