Abstract
Zinc oxide (ZnO) thin films were prepared by DC- magnetron sputtering technique on glass at 500 0 C substrates temperature. The effect of γ-irradiation on the structure and optical properties of the films was investigated. The crystal structure and orientation of the films were studded by XRD pattern. The deposited film is polycrystalline and the dependence of preferred orientation, peak intensities and grain size on the gamma (γ)- irradiation are investigated. The absorption and transmission spectra recorded in the UV/VIS/NIR region for the as deposited and irradiated films The absorption coefficient, optical energy gap, Urbach energy, optical constants (refractive index, extinction coefficient, dielectric constant) and dispersion parameters, such as single-oscillator energy, dispersive energy were determined of irradiated and un- irradiated samples and analyzed.
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