Abstract
Cadmium Telluride (CdTe) thin films of 2000 Å thickness were deposited by thermal evaporation technique and irradiated with γ-ray energy for the times 24 h, 48 h and 72 h. Structure characterized by x-ray diffraction for both as-deposited and irradiated thin films. The increase in irradiation time appeared an improvement of crystallinity. The transmittance spectra of films using Ultraviolet-Visible spectrophotometer showed the increase in irradiation times leads to decreased in transmittance of films. The energy band gap found direct transition and decrease from (1.6-1.53) eV as the irradiation time increase.
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