Effect of Gallium Loading on Reducibility and Dispersion of Copper-Based Catalyst

Abstract

The effect of gallium-promoted copper-based catalysts has been investigated in connection with the characteristic of the active copper phase. CuO-ZnO-Ga2O3catalysts with different gallium loadings were prepared using oxalate co-precipitation method. The effects of gallium loading on the properties of catalysts were studied by means of X-ray diffraction (XRD), transmission electron microscopy (TEM) and temperature-programmed reduction (TPR). The dispersion and metal area of copper were also determined by dissociative nitrous (N2O) adsorption technique conducted on a metal dispersion analyzer (BELCAT). The TPR profiles showed that the presence of two different reduction regions in the CuO-ZnO catalysts can be attributed to the reduction of highly dispersed copper oxide species (reduced at 246 °C) and bulk-like CuO (reduced at above 390 °C). By contrast, the only low-temperature reduction peak was presented in the TPR profiles after the Ga2O3loading was higher than 4 wt%. With the same molar ratio (Cu/Zn = 2:1), the reducibility of CuO-ZnO-Ga2O3was found to be more facile than CuO-ZnO due to the lower copper oxide crystallite sizes of gallium-promoted catalysts. Higher Ga2O3loadings resulted in an increase in both copper dispersion and metal surface area of all the catalysts studied in good agreement with the reduction behaviors in the TPR profiles, although all the gallium-promoted catalysts were slightly different for the reducibility.