Abstract

In this study, (SnO2-xFx) thin films where (x = 0, 0.02, 0.04, 0.06 and 0.08) have been deposited by chemical spray pyrolysis method on glass substrates at temperature of (400°C), using Tin Chloride Pentahydrate (SnCl4.5H2O) and Ammonium Fluoride (NH4F) solutions. The structural properties and morphology of these films have been studied using XRD and AFM respectively. XRD analysis showed that these films are polycrystalline in nature with tetragonal Rutile structure with preferred orientation of (110). Doping with Fluorine causes a decrease in the crystallite size. The optical properties for all the films were studied by recording the transmittance and absorbance spectra in the range of (300-900) nm. The results showed that the absorbance increases with increasing the doping percentage. The optical energy gap for allowed direct electronic transition was calculated and it was found that the thin film with 0.08 doping percentage has the least value of 3.72 eV. Urbach energy decreases with increasing doping percentage. The optical constants (absorption coefficient, refractive index, extinction coefficient, real and imaginary parts of dielectric constant) as a function of photon energy for all prepared films were calculated.

Highlights

  • Tin dioxide (SnO2), is an important n-type semiconductor with tetragonal Rutile structure having lattice parameters a = b = 4.737 Å and c = 3.826 Å

  • Each tin atom is bounded to six oxygen atoms at the corners of a regular octahedron, and every oxygen atom is surrounded by three tin atoms

  • Experiments were conducted at substrate temperature of (400°C) to investigate the effect of Fluorine doping on the growth of the films keeping other parameters constant

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Summary

Introduction

Tin dioxide (SnO2), is an important n-type semiconductor with tetragonal Rutile structure having lattice parameters a = b = 4.737 Å and c = 3.826 Å. The unit cell contains two tin and four oxygen atoms. Each tin atom is bounded to six oxygen atoms at the corners of a regular octahedron, and every oxygen atom is surrounded by three tin atoms. Tin oxide has been extensively investigated for gas sensors, optical-conductive coatings for solar cells and electro catalytic anodes [1, 2], glass coatings for furnace windows as well as transparent electrodes for liquid crystal displays [3]. Tin dioxide (SnO2) has a density of (6.95 g/cm3) and molecular weight of (150.69 g/mol). Its melting point is (2643 K) [4]

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