Abstract
Polycrystalline CdS:In thin films were prepared by the Spray Pyrolysis (SP) technique on glass substrates at a substrate temperature Ts= 490°C. The effect of film thickness on the electrical and structural properties of the films was investigated through the analysis of the I-V plots, x-ray diffraction spectra (XRD) and the scanning electron microscope (SEM) images. The conductivity of the films was highly increased when the films became thicker. The crystal growth became stronger and more oriented as seen in the x-ray diffraction spectra and the grain size became larger as seen in the SEM images.
Highlights
Thin films of CdS have been extensively studied due to the variety of applications in optoelectronic devices
In this study polycrystalline CdS:In thin films were prepared by the spray pyrolysis (SP) technique at a substrate temperature Ts = 490°C
The effects of film thickness on the electrical and structural properties of CdS:In thin films were investigated through the analysis of the I-V plots, the x-ray diffraction spectra (XRD) spectra and the scanning electron microscope (SEM) images
Summary
Thin films of CdS have been extensively studied due to the variety of applications in optoelectronic devices. There are several methods for depositing CdS thin films, such as; vacuum evaporation (VE)[2], chemical bath deposition (CBD)[1,3,4], spray pyrolysis (SP)[5,6], etc. The SP technique is a very low cost and simple technique that enables intentional doping and getting large area and uniform thin films[5, 6]. In this study polycrystalline CdS:In thin films were prepared by the SP technique at a substrate temperature Ts = 490°C. The effects of film thickness on the electrical and structural properties of CdS:In thin films were investigated through the analysis of the I-V plots, the XRD spectra and the SEM images
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