Abstract
In order to isolate the effects of IrMn film grain size, texture and roughness on the temperature dependence of exchange bias field (H/sub ex/) different multilayers of the configuration UL/CoFe4/IrMn5/Ta3 nm (top) and UL/IrMn5/CoFe-4/Ta3 nm (bottom) were deposited. Underlayers (UL) used were Cu, Ru and [Cu1/Ru1 nm]n with thickness varying between 5-100 nm. The H/sub ex/ vs. temperature curve shows a change in shape from a convex type to concave type with increasing the grain size. A qualitative explanation is given based on a thermal fluctuation aftereffect model.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
