Abstract

The effects of F − ions in Yb 3+-doped tellurite glass systems on the emission cross-section and measured fluorescence lifetime are investigated. The results show that both the emission cross-section and the fluorescence lifetime of Yb 3+ ions increase from 1.32 to 1.39 pm 2 and from 0.93 to 1.12 ms respectively with the increase of F − ions from 0 to 10 mol% and that such oxyfluoride tellurite glass system is a promising laser host matrix for high power generation. FT-IR spectra were used to analyze the effect of F − ions on the structure of tellurite glasses and the change of OH − groups in this glass system. Analysis demonstrates that the addition of fluoride decreases the symmetry of the structure of tellurite glasses resulting in increasing of the emission cross-section and removes the OH − groups resulting in increasing of the measured fluorescence lifetime of Yb 3+ ions.

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