Abstract
The electron backscattered diffraction (EBSD) technique and transmission electron microscopy (TEM) were used to characterize the microstructure of a locally deformed single crystal (SX) nickel-base superalloy - CMSX-4. The effect of eutectics on the deformation and recrystallization (RX) behavior was investigated. It was found that the texture component map is a reliable method for the determination of the severity of deformation in locally deformed SX superalloys. Severe deformation was mainly created in interdendritic regions, especially around eutectics. The dislocation distribution and configuration was consistent with the nucleation and the growth behavior of recrystallizing grains. (C) 2011 Elsevier B.V. All rights reserved.
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