Abstract
The abundances of negative ions resulting from 1 keV electron beam irradiation of gaseous NO 2 and its mixtures with H 2 were measured in a high-pressure mass spectrometer. The influence of incident electron energy on the relative clustering efficiency of NO - 3 with HNO 3 and C 2H 5ONO 2 as well as of NO - 2 with HNO 2 and C 2H 5ONO 2 were investigated in NO 2, NO 2- M, HNO 3- M and C 2H 5ONO 2- M ( M = Ar, H 2, N 2, CH 4, C 2,H 6 gas systems. Significant changes in the ratios: R(NO - 3) = ∑ n [NO - 3 ·(HNO 3) n ]/[NO - 3] and R(NO - 2) = (NO - 2 ·HNO 2]/[NO - 2] with change of electron beam energy were found in the case, where the ions originated from NO 2 and its mixtures. The experimental data were correlated with the energy distribution of secondary electrons computed by Monte Carlo simulation of electron degradation in argon. The observed effect of electron beam energy on R(NO - 3) and R(NO - 2) for the systems containing NO 2 was interpreted in terms of a contribution of the excitation energy deposited in NO - 2 by impacting electrons to the internal energy of the (NO - 3 ·HNO 3) and (NO - 2 ·HNO 2) complexes.
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Schedule a callMore From: International Journal of Radiation Applications & Instrumentation. Part C, Radiation Physics & Chemistry
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