Abstract
In this paper, the effect of eccentricity on Junction-based Silicon Nanowire FET, Junction-based Silicon Nanotube FET, Junctionless-based Silicon Nanowire FET, and Junctionless-based Silicon Nanotube FET is investigated. Three kinds of eccentric structures are considered here. The impact of eccentricity on effective gate oxide thickness thereby gate oxide capacitance, and effective channel width are studied using 3D numerical simulations. Average radius of an ellipse is used to generate a model which captures the impact of eccentricity on gate oxide capacitance, and verified using TCAD simulations in MOS nanowire structure. The impact of eccentricity on ON current (ION), OFF current (IOFF), ION/IOFF ratio, and Unity gain cutoff frequency are investigated. Eccentricity increases the effective gate oxide thickness, the effective channel width, ION, and IOFF but reduces ION/IOFF ratio.
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