Abstract
Effect of dimethyl sulfoxide (DMSO) on the electrical properties of PEDOT:PSS/n-Si heterojunction diodes has been studied. Poly(3,4-ethylenedioxythiophene)-poly(styrenesulfonate) (PEDOT:PSS) was deposited on n-type Si wafer using facile process of spin coating. The DMSO content was varied from 0 to 8 vol%. Electrical characterization of these heterojunction diodes as performed using both current–voltage (I–V) and capacitance–voltage (C–V) measurements. All diodes showed rectifying behavior. AFM measurement revealed that the surface became more rough after the DMSO treatment of PEDOT:PSS films. The RMS values were found in the range of 4–6 nm. The resistivity of the PEDOT:PSS films decreased with increase in temperature. The addition of DMSO into PEDOT:PSS solution results in a decrease in resistivity of films by approximately two orders of magnitude. PEDOT:PSS films showed high transmission more than 85% in the entire visible region. Raman spectroscopy indicated effect of the DMSO treatment on the chemical structure of PEDOT chains, suggesting a conformational change of PEDOT chain in the film. An optimal value of DMSO was obtained with 5 vol% content, and it showed the best PEDOT:PSS films properties and good quality heterojunction diodes characteristics with ideality factor of 2.4 and barrier height 0.80 eV.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
