Abstract
Combining secondary ion mass spectroscopy (SIMS) and transmission electron microscopy (TEM), we show that nucleation of PbS nanocrystals formed via co-implantation in pure silica is critically dependent on the post-implant diffusion properties of Pb and S. Upon annealing, implanted Pb diffuses classically whereas only a few percent of the implanted S diffuses significantly. After annealing at 850 °C/1 h, the depth distribution of nanocrystals is no longer determined by the less concentrated element rather than the initial concentration profiles. Our results emphasize the role of glass chemistry in composite nanocrystal formation.
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