Abstract
Changes in the composition of poly[bis(trifluoroethoxy)phosphazene] surface irradiated at λ = 6700 A (a laser), at λ = 9.89 A (1253.6 eV, X-ray Mg-Kα radiation), and at 4720 A (a light emitting diode, (LED) for medical applications) were studied in situ by X-ray photoelectron spectroscopy. Both quantitative and qualitative changes in the surface composition compared to routine measurements of the polymer spectra are observed during an analysis of the surface upon long-term X-ray irradiation or with an increase in the X-ray radiation source power. These are the changes in the concentrations of elements and the appearance of additional states of carbon, oxygen, and nitrogen atoms. The composition of the surface irradiated with the laser and LED remains unchanged.
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