Effect of different polishing systems on the surface roughness of various bulk‐fill and nano‐filled resin‐based composites: An atomic force microscopy and scanning electron microscopy study

Abstract

The aim of the study was to evaluate the effects of different polishing systems on the surface roughness of various bulk-fill and nano-filled resin-based composites using different methods. For the study, a total of 192 disc-shaped samples (10-mm wide and 2-mm thick) were prepared from four different bulk-fill composites (Filtek Bulk Fill, X-tra fil, Beautifil-Bulk Restorative and Fill Up) and two nano-filled resin-based composites (Ceram.x SphereTEC and Filtek Z550). The samples in each composite group were divided into four subgroups according to the polishing system to be used (n=8). Four different polishing systems (Sof-Lex Diamond, Clearfil Twist Dia, HiLuster Plus, OptiDisc) were applied. Then, surface roughness measurements were carried out using a contact-type profilometer. One sample from each group was subjected to atomic force microscopy (AFM) and scanning electron microscope (SEM) examinations. Surface roughness (Ra) values were statistically analyzed in terms of composites and polishing systems using the two-way analysis of variance (ANOVA) and comparisons among groups were performed using the Tukey test (α=.05). Surface roughness values differed significantly in relation to the composite and polishing system used (p < .05). Among all composites, the lowest surface roughness values were obtained in the groups treated with the OptiDisc polishing system (except Beautifil-Bulk Restorative), whereas the highest roughness values were observed in the group polished with Clearfil Twist Dia (except Filtek Z550). X-tra fil showed the highest roughness value with all polishing systems tested. The findings of AFM analyses were consistent with profilometric measurements. The nano-filled resin-based composites showed smoother surface than bulk-fill composites and the type of the polishing systems was found to affect surface roughness.