Abstract
The observed smooth, good I- V behavior of neutron irradiated p +/n/n + silicon detectors in the transition region of junction switching side from p + to n + (space charge sign inversion from positive to negative) has been explained by a space charge limited current model. This simple model involves deep level trapping induced space charge modification that acts as a “negative feed back” for current injection. The injection current levels predicted by the model for which the feed back would work agree well with those observed in the experiments.
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