Abstract
Single crystals of pure and Cu2+doped glycinium oxalate of dimensions 18 × 10 × 2 mm3 and 10 × 7 × 2 mm3 were grown by the solvent evaporation technique, respectively. Influences of Cu2+ ions on the crystalline quality of glycinium oxalate (GOX) crystal were studied. The grown pure and doped crystals were characterized by using powder X-ray diffraction, FT-IR, and FT-Raman techniques. UV–Vis–NIR spectra of GOX and Cu2+ doped GOX single crystals had transparency in the entire visible region with cut off wavelengths, 257 nm and 265 nm, respectively. Mechanical properties of pure and doped crystals were studied using Vicker’s micro-hardness test. The presence of transition metal ion has been confirmed by energy dispersive X-ray spectroscopy (EDAX) and EPR analyses. The g-value (2.4899) was calculated from EPR analysis. The TGA/DTA analysis was performed to find the thermal stability of samples. The dielectric behavior of pure and doped crystal have been reported from 102 to 106 Hz. The third-order NLO properties such as nonlinear absorption coefficient (β), third-order nonlinear susceptibility (χ(3)) and nonlinear refractive indices (n2) of pure and doped crystal were estimated in the order of 10−6 esu.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
More From: Journal of Materials Science: Materials in Electronics
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.