Abstract

The effect of crystalline defects such as dislocations and grain boundary on the cutting behavior of multicrystalline solar silicon is investigated. Diamond scribing experiments reveal significant intra-granular variations in the critical depth of cut for ductile-to-brittle transition in the material. This is explained by characterizing the local dislocation density variations in (100) and (311) grains of a cast multicrystalline silicon wafer and measuring the corresponding elastic modulus, nanoindentation hardness, and fracture toughness. Measured elastic moduli are shown to be higher than theoretical values for defect-free single crystal silicon of the same crystallographic plane. For a given grain orientation, a higher dislocation density is shown to be correlated with higher fracture toughness and a larger critical depth of cut.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.