Abstract
In the present investigation, the effect of copper inclusion on structural, optical and electrical properties of spray deposited ZnO thin films is studied. The X-ray diffraction studies showed that the films are polycrystalline in nature with hexagonal structure. The optical studies revealed that the band gap energy of ZnO increases from 3.23 to 3.31 eV as Cu inclusion varies from 0 to 6 at. %. The dark electrical resistivity measurement was done by two probe method. The room temperature resistivity of ZnO increases from 10−2 to 102 O-cm depending on Cu inclusion. The thermoelectric power (TEP) measurements confirmed that the spray deposited ZnO films exhibits n-type conductivity. The Seebeck’s coefficient calculated from TEP was found in the range 30–11 µVK−1 depending on Cu inclusion.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Materials Science: Materials in Electronics
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
