Abstract
The ferromagnetic resonance linewidth is a result of both intrinsic damping and contributions from inhomogeneities, which in thin films can be dominated by the roughness. Microstructural measurements and magnetization dynamics are reported here for 50-nm films of Permalloy deposited on substrates with controlled roughness. Ferromagnetic resonance measurements reveal a strong linewidth broadening that peaks when the magnetization is approximately 30° from the in-plane direction. These results are compared with a recently developed two-magnon theory of resonance broadening due to inhomogeneous demagnetizing fields in a rough film.
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