Abstract
Thin films of Zinc Oxide (ZnO) having different concentrations were deposited using the Aqueous Chemical Growth (ACG) method. The films were characterized using Rutherford Back Scattering (RBS) spectroscopy for chemical composition and thickness, X-Ray Diffraction (XRD) for crystallographic structure, a UV-VIS spectrophotometer for the analysis of the optical and solid state properties which include spectral absorbance, transmittance, reflectance, refractive index, direct band gap, real and imaginary dielectric constants, absorption and extinction coefficients and a photomicroscope for photomicrographs. The average deposited film thickness was 100 nm. The results indicate that the values of all the optical and solid state properties investigated vary directly with concentration except transmittance which is the reverse. Thus, the optical and solid state properties of ZnO thin film deposited by the Acqueous Chemical Growth method can be tuned by deliberately controlling the concentration of the precursors for various optoelectronic applications including its application as absorber layer in solar cells.
Highlights
IntroductionZinc Oxide is an amphoteric oxide which exists in the form of white powder (zinc white) at room temperature [1]
Zinc Oxide is an amphoteric oxide which exists in the form of white powder at room temperature [1]
The optical and solid state properties of Zinc Oxide (ZnO) thin film deposited by the Acqueous Chemical Growth method can be tuned by deliberately controlling the concentration of the precursors for various optoelectronic applications including its application as absorber layer in solar cells
Summary
Zinc Oxide is an amphoteric oxide which exists in the form of white powder (zinc white) at room temperature [1]. The different polymorphs of ZnO do not possess the property of symmetry inversion This and other properties such as ionic bonding account for the strong piezoelectricity of both hexagonal and zinc blende ZnO [8,9]. As a result of the strategic importance of ZnO to humanity, various deposition methods have been used for its production in the form of thin films. Among the advantages which the ACG method have over the other methods are simplicity, low cost, reproducibility, availability of materials, environmental friendliness (non toxicity of residue), non requirement of surfactant, templates and complexing agents, low temperature requirements, ability to produce nanostructures, high purity (absence of surfactants), suitability for large scale production etc. This paper reports the effect of concentration of precursors on the optical and solid state properties of ZnO thin films deposited using the ACG method with Zn(NO3)2 6H2O as precursor material. The spectral analysis of the optical and solid state properties was carried out using a Unico UV-2102 PC spectrophotometer
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