Effect of chemical bonding and relative density on microwave dielectric properties of LiInW2O8 ceramics

Abstract

To meet the demands of the growing field of electronic communications, LiInW2O8 ceramics with low dielectric loss (high Q×f) and low dielectric constant (εr) are prepared by a solid phase reaction method. X-ray diffractometry reveals a scheelite single-phase structure for the prepared ceramics. Compared with the standard LiInW2O8, the as-prepared LiInW2O8 has a higher relative diffraction intensity for the (200) crystal plane, indicating an anisotropic growth phenomenon in the present case. Raman spectroscopy and calculations of the P-V-L complex chemical bonding theory show that W-O bonding is a key factor affecting the dielectric properties of LiInW2O8 ceramics. Furthermore, excellent microwave dielectric properties with εr ≈ 14.2, Q×f ≈ 63000 GHz, and τf ≈ −28 ppm/℃ are obtained by sintering the ceramic at 1025°C.